Finger Lakes Instrumentation

 

 
Kodak's Defect Classification

CCD Class

Point Defect

Cluster Defect

Column Defect

Total

Zone A

Total

Zone A

Total

Zone A

C0

 0 0 0 0 0

0

C1

equal to or less than 5

 equal to or less than 2 equal to or less than 0 equal to or less than 0 equal to or less than 0 equal to or less than 0

C2

 equal to or less than 10 equal to or less than 5 equal to or less than 4 equal to or less than 2 equal to or less than 2 equal to or less than 0

C3

 equal to or less than 20 equal to or less than 10 equal to or less than 8 equal to or less than 4 equal to or less than 4 equal to or less than 2

Point Defect:  

A pixel which deviates by more than 6% from neighboring pixels when illuminated to 70% saturation.

Cluster Defect:  

A grouping of not more than 5 adjacent point defects.

Column Defect:  

A grouping of point defects along a single column.

Neighboring Pixels:  

The surrounding 100 x 100 pixels or +/- 50 columns/rows.
Defects are separated by no less than 2 pixels in any one direction.
Zone A = ~ Central 2/3 region of the CCD.
Contact FLI for specific CCD information.

TEST CONDITIONS

Temperature:  

25 degrees C
Integration Time:   140 msec
Readout Time:   160 msec
 

 

Scientific Imaging Technologies, Inc. Quality Grade Specifications

SITe SIA 502AB (512x512)

CCD Grade

 1

Points (including clusters)

 10

Columns

 0

 

SITe SIA 003AB (1024x1024)
CCD Grade 1 2
Pixels 40 80
Clusters 6 (3 adjacent) 12 (6 adjacent)
Columns 0 4 (0 adjacent)

 

SITe Quality Grade Definitions
Point Defect An isolated *hot pixel or *dark pixel.
Cluster Defect Two to nine contiguous defective pixels in a single column.
Column Defect Ten or more contiguous defective pixels in a single column.
Hot Pixel A pixel with output 10 times higher than the maximum dark current specifications when the device is integrated under dark conditions. (Measured at -15° C.)
Dark Pixel A pixel with output 50% or less than the average background at a specific light input level.